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1

Methods for joint optimization of mask and design targets for improving lithographic process window

Banerjee, Shayak, Agarwal, Kanak B., Orshansky, Michael

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2013

Language:

english

File:

PDF, 5.05 MB

english, 2013

2

How poverty is measured

MOLLIE ORSHANSKY

Journal:

Monthly Labor Review

Year:

1969

Language:

english

File:

PDF, 830 KB

english, 1969

3

An accurate sparse-matrix based framework for statistical static timing analysis

Anand Ramalingam, Ashish Kumar Singh, Sani R. Nassif, Gi-Joon Nam, Michael Orshansky, David Z. Pan

Journal:

Integration, the VLSI Journal

Year:

2012

Language:

english

File:

PDF, 427 KB

english, 2012

4

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Abnormal ESD failure mode with low-voltage turn-on phenomenon of LDMOS output driver

Park, Jaeyoung, Orshansky, Michael

Year:

2012

Language:

english

File:

PDF, 489 KB

english, 2012

5

[IEEE IEEE 2000 Custom Integrated Circuits Conference - Orlando, FL, USA (21-24 May 2000)] Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044) - New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation

Cao, Y., Sato, T., Orshansky, M., Sylvester, D., Hu, C.

Year:

2000

Language:

english

File:

PDF, 463 KB

english, 2000

6

[IEEE 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) - Washington, DC, USA (2018.4.30-2018.5.4)] 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) - Fresh re-keying with strong PUFs: A new approach to side-channel security

Xi, Xiaodan, Aysu, Aydin, Orshansky, Michael

Year:

2018

Language:

english

File:

PDF, 576 KB

english, 2018

7

Velocity overshoot of electrons and holes in Si inversion layers

D Sinitsky, F Assaderaghi, M Orshansky, J Bokor, C Hu

Journal:

Solid-State Electronics

Year:

1997

Language:

english

File:

PDF, 583 KB

english, 1997

8

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Approximate computing: An emerging paradigm for energy-efficient design

Han, Jie, Orshansky, Michael

Year:

2013

Language:

english

File:

PDF, 1.66 MB

english, 2013

9

[ACM Press the The 51st Annual Design Automation Conference - San Francisco, CA, USA (2014.06.01-2014.06.05)] Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14 - Enabling Efficient Analog Synthesis by Coupling Sparse Regression and Polynomial Optimization

Wang, Ye, Orshansky, Michael, Caramanis, Constantine

Year:

2014

Language:

english

File:

PDF, 320 KB

english, 2014

10

Disinfection of effluents by combinations of chlorine dioxide and chlorine

N. Narkis, A. Katz, F. Orshansky, Y. Kott, Y. Friedland

Journal:

Water Science and Technology

Year:

1995

Language:

english

File:

PDF, 807 KB

english, 1995

11

[IEEE 2017 Symposium on VLSI Circuits - Kyoto, Japan (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Circuits - A sequence dependent challenge-response PUF using 28nm SRAM 6T bit cell

Jeloka, Supreet, Yang, Kaiyuan, Orshansky, Michael, Sylvester, Dennis, Blaauw, David

Year:

2017

Language:

english

File:

PDF, 413 KB

english, 2017

12

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Optical Microlithography XIII - Characterization of spatial CD variability, spatial mask-level correction, and improvement of circuit performance

Orshansky, Michael, Milor, Linda, Brodsky, Michael, Nguyen, Ly, Hill, Gene, Peng, Yeng-Kaung, Hu, Chenming, Progler, Christopher J.

Year:

2000

Language:

english

File:

PDF, 929 KB

english, 2000

13

Effect of suspended solids on wastewater disinfection efficiency by chlorine dioxide

Nava Narkis, Robert Armon, Regina Offer, Frieda Orshansky, Eugenia Friedland

Journal:

Year:

1995

Language:

english

File:

PDF, 601 KB

english, 1995

14

Shape slack: a design-manufacturing co-optimization methodology using tolerance information

Banerjee, Shayak, Agarwal, Kanak B., Nassif, Sani, Orshansky, Michael

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2013

Language:

english

File:

PDF, 2.25 MB

english, 2013

15

[IEEE 2010 IEEE Custom Integrated Circuits Conference -CICC 2010 - San Jose, CA, USA (2010.09.19-2010.09.22)] IEEE Custom Integrated Circuits Conference 2010 - Ground rule slack aware tolerance-driven optical proximity correction for local metal interconnects

Banerjee, Shayak, Agarwal, Kanak, Orshansky, Michael

Year:

2010

Language:

english

File:

PDF, 252 KB

english, 2010

16

Disinfection of effluent by combinations of equal doses of chlorine dioxide and chlorine added simultaneously over varying contact times

Anat Katz, Nava Narkis, Frieda Orshansky, Evgenia Friedland, Yehuda Kott

Journal:

Year:

1994

Language:

english

File:

PDF, 551 KB

english, 1994

17

[ACM Press the 35th annual conference - San Francisco, California, United States (1998.06.15-1998.06.19)] Proceedings of the 35th annual conference on Design automation conference - DAC '98 - A statistical performance simulation methodology for VLSI circuits

Orshansky, Michael, Chen, James C., Hu, Chenming

Year:

1998

Language:

english

File:

PDF, 288 KB

english, 1998

18

[ACM Press the 16th ACM/IEEE international symposium - Austin, Texas, USA (2010.08.18-2010.08.20)] Proceedings of the 16th ACM/IEEE international symposium on Low power electronics and design - ISLPED '10 - NBTI-aware DVFS

Basoglu, Mehmet, Orshansky, Michael, Erez, Mattan

Year:

2010

Language:

english

File:

PDF, 976 KB

english, 2010

19

[IEEE International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (5-9 Nov. 2000)] IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) - Impact of systematic spatial intra-chip gate length variability on performance of high-speed digital circuits

Orshansky, M., Milor, L., Pinhong Chen,, Keutzer, K., Chenming Hu,

Year:

2000

Language:

english

File:

PDF, 717 KB

english, 2000

20

Spice up your MOSFET modelling

Yu Cao, Orshansky, M., Sato, T., Sylvester, D., Chenming Hu

Journal:

IEEE Circuits and Devices Magazine

Year:

2003

Language:

english

File:

PDF, 13.17 MB

english, 2003

21

[IEEE 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Austin, TX, USA (2013.06.2-2013.06.3)] 2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - Novel strong PUF based on nonlinearity of MOSFET subthreshold operation

Kalyanaraman, Mukund, Orshansky, Michael

Year:

2013

Language:

english

File:

PDF, 1.16 MB

english, 2013

22

Electronic Health Record–Based Interventions for Improving Appropriate Diagnostic Imaging

Goldzweig, Caroline Lubick, Orshansky, Greg, Paige, Neil M., Miake-Lye, Isomi M., Beroes, Jessica M., Ewing, Brett A., Shekelle, Paul G.

Journal:

Annals of Internal Medicine

Year:

2015

Language:

english

File:

PDF, 266 KB

english, 2015

23

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization

Mani, Murari, Sing, Ashish K., Orshansky, Michael

Year:

2006

Language:

english

File:

PDF, 149 KB

english, 2006

24

[ACM Press the 8th ACM/IEEE international workshop - Monterey, California, USA (2002.12.02-2002.12.03)] Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems - TAU '02 - From blind certainty to informed uncertainty

Keutzer, Kurt, Orshansky, Michael

Year:

2002

Language:

english

File:

PDF, 238 KB

english, 2002

25

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Simultaneous OPC and decomposition for double exposure lithography

Banerjee, Shayak, Agarwal, Kanak B., Orshansky, Michael

Year:

2011

Language:

english

File:

PDF, 507 KB

english, 2011

26

[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy (24-26 May 2006)] 2006 IEEE International Conference on IC Design and Technology - Statistical Minimization of Total Power under Timing Yield Constraints

Year:

2006

Language:

english

File:

PDF, 424 KB

english, 2006

27

[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Approximate logic synthesis under general error magnitude and frequency constraints

Miao, Jin, Gerstlauer, Andreas, Orshansky, Michael

Year:

2013

Language:

english

File:

PDF, 737 KB

english, 2013

28

[IEEE 56th Annual Device Research Conference Digest - Charlottesville, VA, USA (22-24 June 1998)] 56th Annual Device Research Conference Digest (Cat. No.98TH8373) - Impact of velocity overshoot, polysilicon depletion, and inversion layer quantization on NMOSFET scaling

Orshansky, M., Sinitsky, D., Scrobahaci, P., Bokor, J., Hu, C.

Year:

1998

File:

PDF, 509 KB

1998

29

[ACM Press the 42nd annual conference - San Diego, California, USA (2005.06.13-2005.06.17)] Proceedings of the 42nd annual conference on Design automation - DAC '05 - An efficient algorithm for statistical minimization of total power under timing yield constraints

Mani, Murari, Devgan, Anirudh, Orshansky, Michael

Year:

2005

Language:

english

File:

PDF, 611 KB

english, 2005

30

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Design for Manufacturability through Design-Process Integration II - Electrically driven optical proximity correction

Banerjee, Shayak, Singh, Vivek K., Rieger, Michael L., Elakkumanan, Praveen, Liebmann, Lars W., Culp, James A., Orshansky, Michael

Year:

2008

Language:

english

File:

PDF, 369 KB

english, 2008

31

Characteristics of organics removal by PACT simultaneous adsorption and biodegradation

Frieda Orshansky, Nava Narkis

Journal:

Year:

1997

Language:

english

File:

PDF, 680 KB

english, 1997

32

[IEEE 2013 14th International Symposium on Quality Electronic Design (ISQED 2013) - Santa Clara, CA (2013.3.4-2013.3.6)] International Symposium on Quality Electronic Design (ISQED) - Low-energy digital filter design based on controlled timing error acceptance

Ku He,, Gerstlauer, A., Orshansky, M.

Year:

2013

Language:

english

File:

PDF, 715 KB

english, 2013

33

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - Accurate waveform modeling using singular value decomposition with applications to timing analysis

Ramalingam, Anand, Singh, Ashish Kumar, Nassif, Sani R., Orshansky, Michael, Pan, David Z.

Year:

2007

Language:

english

File:

PDF, 190 KB

english, 2007

34

[ACM Press the 50th Annual Design Automation Conference - Austin, Texas (2013.05.29-2013.06.07)] Proceedings of the 50th Annual Design Automation Conference on - DAC '13 - Gene modification identification under flux capacity uncertainty

Yousofshahi, Mona, Orshansky, Michael, Lee, Kyongbum, Hassoun, Soha

Year:

2013

Language:

english

File:

PDF, 435 KB

english, 2013

35

The Roster of Poverty

Mollie Orshansky

Journal:

Monthly Labor Review

Year:

1965

Language:

english

File:

PDF, 907 KB

english, 1965

36

Electronic Patient Portals: Evidence on Health Outcomes, Satisfaction, Efficiency, and Attitudes

Goldzweig, Caroline Lubick, Orshansky, Greg, Paige, Neil M., Towfigh, Ali Alexander, Haggstrom, David A., Miake-Lye, Isomi, Beroes, Jessica M., Shekelle, Paul G.

Journal:

Annals of Internal Medicine

Year:

2013

Language:

english

File:

PDF, 207 KB

english, 2013

37

Predictable Equation-Based Analog Optimization Based on Explicit Capture of Modeling Error Statistics

Singh, Ashish Kumar, Ragab, Kareem, Lok, Mario, Caramanis, Constantine, Orshansky, Michael

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 3.36 MB

english, 2012

38

[ACM ISLPED International Symposium on Low-Power Electronics and Design - Seoul, South Korea (25-27 Aug. 2003)] Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003. ISLPED '03. - Minimization of dynamic and static power through joint assignment of threshold voltages and sizing optimization [logic IC design]

Nguyen, D., Davare, A., Orshansky, M., Chinnery, D., Thompson, B., Keutzer, K.

Year:

2003

Language:

english

File:

PDF, 607 KB

english, 2003

39

Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation

M. Liu, W. Wang, M. Orshansky

Year:

2004

Language:

english

File:

PDF, 151 KB

english, 2004

40

Probabilistic strain optimization under constraint uncertainty

Mona Yousofshahi, Michael Orshansky, Kyongbum Lee, Soha Hassoun

Journal:

BMC Systems Biology

Year:

2013

Language:

english

File:

PDF, 288 KB

english, 2013

41

[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Embracing local variability to enable a robust high-gain positive-feedback amplifier: Design methodology and implementation

Ragab, Kareem, Gharpurey, Ranjit, Orshansky, Michael

Year:

2012

Language:

english

File:

PDF, 386 KB

english, 2012

42

[ACM Press the 52nd Annual Design Automation Conference - San Francisco, California (2015.06.07-2015.06.11)] Proceedings of the 52nd Annual Design Automation Conference on - DAC '15 - Novel power grid reduction method based on L1 regularization

Wang, Ye, Li, Meng, Yi, Xinyang, Song, Zhao, Orshansky, Michael, Caramanis, Constantine

Year:

2015

Language:

english

File:

PDF, 251 KB

english, 2015

43

[IEEE 2007 IEEE International Symposium on Nanoscale Architectures - San Jose, CA, USA (2007.10.21-2007.10.22)] 2007 IEEE International Symposium on Nanoscale Architectures - A heterogeneous CMOS-CNT architecture utilizing novel coding of boolean functions

Ashish Singh,, Hady Ali Zeineddine,, Adnan Aziz,, Sriram Vishwanath,, Orshansky, Michael

Year:

2007

Language:

english

File:

PDF, 202 KB

english, 2007

44

[IEEE Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - Taipei, Taiwan (June 3-5, 1997)] Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - An Extension Of BSIM3 Model Incorporating Velocity Overshoot

Sinitshy, D., Assaderaghi, F., Orshansky, M., Bokor, J., Chenming Hu,

Year:

1997

Language:

english

File:

PDF, 298 KB

english, 1997

45

[IEEE IWSM. 1998 3rd International Workshop on Statistical Metrology - Honolulu, HI, USA (7 June 1998)] IWSM. 1998 3rd International Workshop on Statistical Metrology (Cat. No.98EX113) - Approaches to statistical circuit analysis for deep sub-micron technologies

Orshansky, M., Chen, J.C., Hu, C., Wan, D., Bendix, D.

Year:

1998

Language:

english

File:

PDF, 301 KB

english, 1998

46

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - A methodology for propagating design tolerances to shape tolerances for use in manufacturing

Banerjee, Shayak, Agarwal, Kanak B, Chin-Ngai Sze,, Nassif, Sani, Orshansky, Michael

Year:

2010

Language:

english

File:

PDF, 283 KB

english, 2010

47

[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - An accurate sparse matrix based framework for statistical static timing analysis

Ramalingam, Anand, Nam, Gi-Joon, Singh, Ashish Kumar, Orshansky, Michael, Nassif, Sani R., Pan, David Z.

Year:

2006

Language:

english

File:

PDF, 180 KB

english, 2006

48

[IEEE 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2014.11.2-2014.11.6)] 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Multi-level approximate logic synthesis under general error constraints

Miao, Jin, Gerstlauer, Andreas, Orshansky, Michael

Year:

2014

Language:

english

File:

PDF, 773 KB

english, 2014

49

[ACM Press the International Conference - San Jose, California (2012.11.05-2012.11.08)] Proceedings of the International Conference on Computer-Aided Design - ICCAD '12 - Modeling and synthesis of quality-energy optimal approximate adders

Miao, Jin, He, Ku, Gerstlauer, Andreas, Orshansky, Michael

Year:

2012

Language:

english

File:

PDF, 871 KB

english, 2012

50

Variation-Tolerant Write Completion Circuit for Variable-Energy Write STT-RAM Architecture

Park, Jaeyoung, Zheng, Tianhao, Erez, Mattan, Orshansky, Michael

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 2.31 MB

english, 2015

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